Customizable Semiconductor Test: NIWeek 2009 Keynote

niglobal asked:


Visit www.ni.com National Instruments offers a variety of products for testing common semiconductor devices, including ADCs/DACs, Power Management ICs, Wireless ICs, and microelectromechanical system (MEMS) devices for both characterization and production environments. PXI and LabVIEW offer a flexible platform for taking custom, one-off measurements to quickly measure the performance of a chip. Jeremy Meier, group manager, and Ryan Mosley, senior HW engineer for PXI and modular instruments …

Nanotech Manufacturers

Pas de Deux avec les Microrobots

igorpapa asked:


we have previously demonstrated in 2005. More information can be found here: www.cs.duke.edu References: [1] BR Donald, CG Levey and I. Paprotny. “Planar Microassembly by Parallel Actuation of MEMS Microrobots.” Journal of Microelectromechanical Systems, 2008 (Accepted; In press). [2] BR Donald, CG Levey and I. Paprotny. “Assembly of Planar Structures by Parallel Actuation of MEMS Microrobots.” The Technical Digest of the 2008 Solid-State Sensor and Actuator Workshop, Hilton Head Isl., …

Philippe Kahn Goes Full Power with Sensors/MEMS, iPhone nano

uberpulse asked:


proximity, ambient light, pressure, compass, GPS, etc… into actionable information instantaneously. Currently the Wii and the iPhone are the most famous consumer electronic devices that make use of such motion sensors based on Microelectromechanical systems (MEMS) technology. “But the Wii and iPhone are just the beginning. Sensors will soon enable all kinds of functions, such as shaking your cell phone to pick up a call. No buttons, no fingers, just simple, natural gestures”. Kahn (pictured …

Nanotech Websites

Royal Society Brian Mercer Award for Innovation 2008 – Professor Horoshenkov

RoyalSociety asked:


project hopes to develop an airborne acoustic sensor that can rapidly and objectively measure in-pipe condition, and identify blockages and damage. This technology will be developed to a near-market prototype and offer an up to 100-fold improvement in the productivity of sewer inspection. This work relies on novel MEMS (microelectromechanical systems) devices and advanced methods of signal analysis. More at royalsociety.org … HOROSHENKOV “built environment” “brian mercer” “royal society …

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