Visit www.ni.com National Instruments offers a variety of products for testing common semiconductor devices, including ADCs/DACs, Power Management ICs, Wireless ICs, and microelectromechanical system (MEMS) devices for both characterization and production environments. PXI and LabVIEW offer a flexible platform for taking custom, one-off measurements to quickly measure the performance of a chip. Jeremy Meier, group manager, and Ryan Mosley, senior HW engineer for PXI and modular instruments …

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we have previously demonstrated in 2005. More information can be found here: www.cs.duke.edu References: [1] BR Donald, CG Levey and I. Paprotny. “Planar Microassembly by Parallel Actuation of MEMS Microrobots.” Journal of Microelectromechanical Systems, 2008 (Accepted; In press). [2] BR Donald, CG Levey and I. Paprotny. “Assembly of Planar Structures by Parallel Actuation of MEMS Microrobots.” The Technical Digest of the 2008 Solid-State Sensor and Actuator Workshop, Hilton Head Isl., …